DDR5数据缓冲测试
DDR5 RDIMM及支持下一代MR-DIMM单体测试验证系统 (DDR5 MR-DIMM Module Test System), 支持的速率可高达17.4Gbps.
DDR5 RDIMM测试系统，DDR5内存测试系统， DDR5 MR-DIMM测试系统，DDR5 RCD/DB芯片测试，DDR5芯片测试，DDR5接收机测试，DDR5发射机测试，DDR5数据缓冲测试，DDR5误码测试仪，DDR5寄存器芯片测试，DDR5 DIMM Module测试系统，DDR5 DRAM测试系统
The M5513 is an all-inclusive memory test system for next-generation DDR5 multiplexed-rank dual inline
memory modules (MR-DIMM). Operating at blisteringly fast speeds, this test system is an ideal solution for longterm
DIMM development and test. It contains a complete side-band bus controller and provides full access to all
command, address, and data pins on a standard 288-pin DIMM under test. The M5513 can characterize the DDR
interface at its maximum speed, and it can also perform exhaustive memory read-write testing and functional
stress testing. A true ATE-on-Bench, the M5513 reduces cost and enhances interoperability of DDR5 systems.
DDR5 RDIMM测试系统，DDR5内存测试系统， DDR5 MR-DIMM测试系统，DDR5 RCD/DB芯片测试，DDR5芯片测试，DDR5接收机测试，DDR5发射机测试，DDR5数据缓冲测试，DDR5误码测试仪，DDR5寄存器芯片测试，DDR5 DIMM Module测试系统，DDR5 DRAM测试系统
The M5513 is an all-inclusive memory test system for next-generation DDR5 multiplexed-rank dual inline
memory modules (MR-DIMM). Operating at blisteringly fast speeds, this test system is an ideal solution for longterm
DIMM development and test. It contains a complete side-band bus controller and provides full access to all
command, address, and data pins on a standard 288-pin DIMM under test. The M5513 can characterize the DDR
interface at its maximum speed, and it can also perform exhaustive memory read-write testing and functional
stress testing. A true ATE-on-Bench, the M5513 reduces cost and enhances interoperability of DDR5 systems.
